Features: Dual-channel System SourceMeter Instrument (200V) Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller—all in one instrument 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times The embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 SourceMeter channels into a system that can be programmed and controlled as a single instrument Free Test Script Builder software simplifies creating powerful test scripts for programming custom test functions Each SourceMeter channel is electrically isolated for high integrity measurements and wiring flexibility Industry’s highest SMU rack density for automated test applications Contact check function ensures high integrity measurements (2601/2602/2611/2612) Series 2600 System SourceMeter instruments offer electronic component and semiconductor device manufacturers a scalable, high throughput, highly cost-effective solution for precision DC, pulse, and low frequency AC sourcemeasure testing. Building on the tightly integrated source-measure technology originally developed for Keithley’s popular Series 2400 SourceMeter line, Series 2600 instruments provide from two to four times the test speed of competitive solutions in I-V functional test applications. They also offer higher source-measure channel density and a significantly lower cost of ownership than competing products. The analog-to-digital converters provide simultaneous I and V measurements in less than 100μs (10,000 rdgs/s) and source-measure sweep speeds of less than 200μs per point (5,500 points/s). This high speed source- measure capability, plus advanced automation features and time-saving software tools make Series 2600 SourceMeter instruments an ideal solution for I-V testing of a wide range of devices. The image is a representation of selection. See specifications for product details.
