4145B Agilent Semiconductor Parameter Analyzer Used

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Additional Features: Fully automatic, high-speed DC characterization of semiconductor devices High resolution, wide range sourcing and measurement. I: 1pA - 100mA, V: 1mV - 100V Ma ximum 1150 measurement and display points for precise measurement and analysis Flexible graphic analysis functions for quick parameter extraction Built-in micro flexible disc drive for storage of 240 user programs or 105 measurement results The Agilent 4145B is a stand-alone instrument capable of complete DC characterization of semiconductor devices and materials. The Agilent 4145B stimulates voltage and current sensitive devices, measures the resulting current and voltage response, and displays the results in a user-selectable format (graph, list, matrix or schmoo) on a built-in CRT display. Show more