Reticle 35mm Calibration Rule .005In/.100mm Centered This English and Metric micrometer reticle is used for critical measurements of object features. The English scale measures -0.45” to + 0.45” in 0.005” increments. The metric scale measures -12mm to +12mm in 0.050mm increments. The pattern line width is 0.0002” ±0.00004” (0.005mm ± 0.001mm). The pattern has an overall accuracy of 0.00004” (0.001mm).The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions. Click here to download drawing 35mm Compatibility Chart Full Compatibility Chart
