AA117

Max Levy Verified independent store

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Reticle 35mm metric squares, 2 to 10 mm/2mm increments This reticle can be used for gauging Field of View, cropped dimensions, centering, and more. The Field of View measurement is useful in calibrating digital imaging systems. The pattern consists of 5 concentric squares: 2, 4, 6, 8, and 10mm. The pattern line width is 0.025mm ±0.0025mm. The pattern has an overall accuracy of 0.001mm.The Pattern is right reading looking through the glass so that the pattern can be in direct contact with the object to be measured. The Reticle Pattern is very durable, double layer, deposited evaporative Chrome/Chrome Oxide, for a reflectivity of less than 5% looking at the pattern. The Patterns on all Reticles manufactured by Max Levy are replicated from Precision Chrome on Glass Tooling under clean room conditions. Click here to download drawing 35mm Compatibility Chart Full Compatibility Chart Show more