Conductive AFM Probes

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Tap300E-G (Also known as ElectriTap300-G) Tapping Mode AFM Probe with Platinum Overall Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 40 N/m (20 - 75 N/m)* Resonance Frequency: 300 kHz (200 - 400 kHz)* Length: 125 µm (115 - 135 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 4 µm (3 - 5 µm)* * typical range Coating Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! Tap190E-G (Also known as ElectriTap190-G) Tapping Mode AFM Probe with Long Cantilever and Platinum Overall Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 48 N/m (28 - 75 N/m)* Resonance Frequency: 190 kHz (160 - 220 kHz)* Length: 225 µm (215 - 235 µm)* Width: 38 µm (33 - 43 µm)* Thickness: 7 µm (6 - 8 µm)* * typical range Coating Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. BudgetSensors' Tap190 series features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series. Consistent high quality at a lower price! Tap150E-G (Also known as ElectriTap150-G) Soft Tapping Mode AFM Probe with Platinum Overall Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 5 N/m (1.5 - 15 N/m)* Resonance Frequency: 150 kHz (75 - 225 kHz)* Length: 125 µm (115 - 135 µm)* Width: 25 µm (20 - 39 µm)* Thickness: 2.1 µm (1.1 - 3.1 µm)* * typical range Coating Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! Multi75E-G (Also known as ElectriMulti75-G) Force Modulation AFM Probe with Platinum Overall Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 3 N/m (1 - 7 N/m)* Resonance Frequency: 75 kHz (60 - 90 kHz)* Length: 225 µm (215 - 235 µm)* Width: 28 µm (23 - 33 µm)* Thickness: 3 µm (2 - 4 µm)* * typical range Coating Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! ContE-G (Also known as ElectriCont-G) Contact Mode AFM Probe with Platinum Overall Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 0.2 N/m (0.07 - 0.4 N/m)* Resonance Frequency: 13 kHz (9 - 17 kHz)* Length: 450 µm (440 - 460 µm)* Width: 50 µm (45 - 55 µm)* Thickness: 2 µm (1 - 3 µm)* * typical range Coating Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for contact mode and lateral force mode operation and electric modes such as scanning capacitance microscopy (SCM). The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! AIOE (Also known as ElectriAll-In-One) Multipurpose AFM Probe with 4 Different Cantilevers and Platinum Overall Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 25 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex 4 AFM Cantilevers Cantilever A - Contact Mode Shape: Beam Force Constant: 0.2 N/m (0.04 - 0.7 N/m)* Resonance Frequency: 15 kHz (10 - 20 kHz)* Length: 500 µm (490 - 510 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* Cantilever B - Force Modulation Shape: Beam Force Constant: 2.7 N/m (0.4 - 10 N/m)* Resonance Frequency: 80 kHz (50 - 110 kHz)* Length: 210 µm (200 - 220 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* Cantilever C - Soft Tapping Shape: Beam Force Constant: 7.4 N/m (1 - 29 N/m)* Resonance Frequency: 150 kHz (70 - 230 kHz)* Length: 150 µm (140 - 160 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* Cantilever D - Tapping Mode Shape: Beam Force Constant: 40 N/m (7 - 160 N/m)* Resonance Frequency: 350 kHz (200 - 500 kHz)* Length: 100 µm (90 - 110 µm)* Width: 50 µm (45 - 55 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* * typical range Coating Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever. Alignment Grooves none Additional Info Versatile monolithic silicon AFM probe with 4 different platinum coated AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) The rotated AFM tips allow for more symmetric representation of high sample features. The consistent AFM tip radii ensure good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose in the very last moment the right AFM cantilever for each application. You dont need to stock various AFM Probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the ElectriAll-In-One AFM cantilevers differs from the geometry of comparable specialized single-cantilever AFM probes. BudgetSensors offers consistent high quality at a lower price! AIO-DD (Also known as All-In-One-DD) Multipurpose AFM Probe with 4 Different Cantilevers and Conductive Diamond Tip Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 250 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex 4 AFM Cantilevers Cantilever A - Contact Mode Shape: Beam Force Constant: 0.5 N/m (0.2 - 0.9 N/m)* Resonance Frequency: 19 kHz (16 - 24 kHz)* Length: 500 µm (490 - 510 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* Cantilever B - Force Modulation Shape: Beam Force Constant: 6.5 N/m (3 - 12 N/m)* Resonance Frequency: 110 kHz (80 - 140 kHz)* Length: 210 µm (200 - 220 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* Cantilever C - Soft Tapping Shape: Beam Force Constant: 18 N/m (8 - 35 N/m)* Resonance Frequency: 200 kHz (140 - 260 kHz)* Length: 150 µm (140 - 160 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* Cantilever D - Tapping Mode Shape: Beam Force Constant: 100 N/m (48 - 190 N/m)* Resonance Frequency: 450 kHz (230 - 600 kHz)* Length: 100 µm (90 - 110 µm)* Width: 50 µm (45 - 55 µm)* Thickness: 2.7 µm (1.7 - 3.7 µm)* * typical range Coating Boron doped polycrystalline diamond tip coating, 100 nm thick; Aluminum coating on detector side of the cantilever, 30 nm thick. Alignment Grooves none Additional Info Versatile monolithic silicon AFM probe with 4 different AFM cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping / non-contact mode and electric modes such as: scanning capacitance microscopy (SCM), electrostatic force microscopy (EFM), Kelvin probe force microscopy (KFM), scanning probe lithography and conductive atomic force microscopy (C-AFM). The doped polycristalling diamond AFM tip coating provides unprecedented hardness and durability, as well as electridcal conductivity for demanding electrical applications. The resulting AFM tip radius is in the range 100-250nm. The rotated AFM tips allow for more symmetric representation of high sample features. The AFM holder chip fits most commercial AFM systems as it is industry standard size. The main advantage of this product compared to regular, single-cantilever AFM probes is the freedom to choose the right AFM cantilever for each application in the very last moment. You do not need to stock various AFM probe types any more. Nevertheless, this product is not meant as a substitution to comparable single-cantilever AFM probes, because the geometry of each one of the All-In-One AFM cantilevers differs from the geometry of the comparable specialized single-cantilever AFM probes. Please note that the aluminum back side coating is not suitable for measurements in liquids! Consistent high quality at a lower price! Show more