S. J. B. ReedCambridge University PressEdition: 2, 7/10/1997EAN 9780521599443, ISBN10: 052159944XPaperback, 350 pages, 22.9 x 15.2 x 2.2 cmLanguage: EnglishThis 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.1. Introduction2. Essential features of the electron microprobe3. Electron gun4. The probe-forming system5. Scanning6. Wavelength-dispersive spectrometers7. Proportional counters8. Counting electronics9. Lithium-drifted silicon detectors10. Electronics for energy-dispersive systems11. Wavelength-dispersive analysis12. Energy-dispersive analysis13. X-ray generation and stopping power14. Electron backscattering15. Absorption corrections16. Fluorescence corrections17. Matrix corrections in practice18. Light element analysisAppendixorigin of characteristic X-rays.
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