EMC-Test-Master for IO-Link

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The IO-Link specification has well defined procedures to test the EMC robustness of IO-Link devices. Some tests check the sensitivity of the IO-Link communication of IO-Link device s under EMC conditions. This test requires a robust master that is much less sensitive to EMC noise than the device under test. This requirement is achieved by separating the IO-Link master into two parts: part 1 contains the sensitive digital logic (µC- box) part 2 contains the IO-Link transceiver (PHY-box) Both parts are separated by an optical connection with a length of up to 10m. Show more