FAS1000-TC Frequency Acquisition System, Temperature-Controlled

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XO/VCXO/TCXO Full-Temperature Test System Key Features Simultaneous frequency acquisition Zero-dead-time readings Independent counter per channel Backplane Architecture 16 - 64 DUT s per card DIN connectors for robust swapping Enables wider testing capability: Frequency vs. Temperature ADEV Trim Effect Warm-up Microjumps Thermal Hysteresis Applications Enables temperature qualification of systems based on precision timing including: GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, A.I. Data Centers, and more. Ideal for TCXO manufacturers to test the majority of frequency-based parameters such as frequency vs. temperature, ADEV, and warm-up at production volumes. Show more