FAS300-H Burn-in Aging System for XO/VCXO/TCXO

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. OCXO Aging and Room-Temperature ADEV System Key Features Simultaneous frequency acquisition Zero-dead-time readings Independent counter per channel Gate times of 10ms to 24 hours High channel-to-channel isolation Backplane Architecture 16 - 64 DUTs per card DIN connectors for robust swapping Applications Enables room-temperature qualification of systems based on precision timing including: GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, A.I. Data Centers, and more. Ideal for OCXO manufacturers to test frequency-based parameters such as ADEV and warm-up at production volumes. Show more