Development of Low-Frequency AC Voltage Measurement System Using Single-Junction Thermal Converter

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カテゴリ: 論文誌(論文単位)グループ名: 【A】基礎・材料・共通部門発行日: 2012/03/01タイトル(英語): Development of Low-Frequency AC Voltage Measurement System Using Single-Junction Thermal Converter著者名: Yasutaka Amagai ( National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and Technology (AIST)), Yasuhiro Nakamura (National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and T著者名(英語): Yasutaka Amagai (National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and Technology (AIST)), Yasuhiro Nakamura (National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industrial Science and Technology (AIST))キーワード: AC-DC difference，electrical variable measurement，numerical analysis，thermal converters，thermal transfer standards要約(英語): Accurate measurement of low-frequency AC voltage using a digital multimeter at frequencies of 4-200Hz is a challenge in the mechanical engineering industry. At the National Metrology Institute of Japan, we developed a low-frequency AC voltage measurement system for calibrating digital multimeters operating at frequencies down to 1 Hz. The system uses a single-junction thermal converter and employs a theoretical model and a three-parameter sine wave fitting algorithm based on the least-square (LS) method. We calibrated the AC voltage down to 1Hz using our measurement system and reduced the measurement time compared with that using thin-film thermal converters. Our measurement results are verified by comparison with those of a digital sampling method using a high-resolution analog-to-digital converter; our data are in agreement to within a few parts in 105. Our proposed method enables us to measure AC voltage with an uncertainty of 25 μV/V (k = 1) at frequencies down to 4 Hz and a voltage of 10 V.本誌: 電気学会論文誌A（基礎・材料・共通部門誌） Vol.132 No.3 （2012） 特集：平成23 年基礎・材料・共通部門大会本誌掲載ページ: 214-219 p原稿種別: 論文／英語電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejfms/132/3/132_3_214/_article/-char/ja/ Show more