カテゴリ: 論文誌(論文単位)グループ名: 【D】産業応用部門（英文）発行日: 2013/07/01タイトル(英語): Coping with Poor Dynamic Performance of Super-Junction MOSFET Body Diodes著者名: Martin Pavlovsky (Yokohama National University), Giuseppe Guidi (Yokohama National University), Atsuo Kawamura (Yokohama National University)著者名(英語): Martin Pavlovsky (Yokohama National University), Giuseppe Guidi (Yokohama National University), Atsuo Kawamura (Yokohama National University)キーワード: superjunction MOSFET，body diode，reverse recovery，forward recovery，soft switching要約(英語): Poor dynamic performance of body diodes in Super Junction MOSFETs may cause difficulties when utilised in high frequency conversion circuits. Excessive reverse recovery as well as forward recovery may in the best case result in high conversion losses and EMI pollution where as in the worst case they may completely disrupt the converter operation. In this paper, using an auxiliary snubber circuit to control the reverse recovery and connecting a fast diode in parallel to a super junction switch to reduce the forward recovery is proposed. As documented by numerous experimental results, both proposed concepts work well and both recoveries may be largely avoided. Implementation of the proposed concepts in a forward boost, reverse buck circuit resulted in efficiencies close to 98.5% in 3-12.5kW load range while operating at 62.5kHz.本誌: IEEJ Journal of Industry Applications Vol.2 No.4 （2013） Special Issue on Power Electronics本誌掲載ページ: 183-188 p原稿種別: 論文／英語電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejjia/2/4/2_183/_article/-char/ja/
