Admittance-Based Bilateral Control with Micro Reaction Force Estimation by Optical Tweezer

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カテゴリ: 国際会議グループ名: SAMCON2025発行日: 2024/03/19著者名(英語): Moyu Otsuka and Saki Kozu (Keio University, Japan); Koji Niwa (Graduate School of Keio University, Japan); Kazunobu Hashikawa (Na goya University, Japan); Takahiro Nozaki (Keio University, Japan)PDFファイルサイズ: 1,644 Kバイト Show more