JX2008-LD resistivity tester is a portable and multi-functional 4 probes resistivity testing instrument, which is based on the principle of the four-point probe measurement. It can be used to measure the radial and axial resistivity of the sheet or block semiconductor materials and is widely applied for filtration in semiconductor and solar industries. Feature: Preset the sample thickness with the self-correcting function Measure the resistivity and show the value directly Test the P/N type of semiconductor accurately Set up the alarm threshold of the P/N type Specifications: Power Adaptor: Input: 100 - 240V AC, 50/60Hz, 0.8 Output: +15V, 2.0 A Size: 155×120×50mm Testing Range: 0.001-100 ohm-cm Resistivity Testing Accuracy: ± 5% ± 2LSB Minimum Testing Area: 10mm x 10mm If the testing sample is smaller, you may order High Conductive Silver Epoxy ( click picture below right to order )and lead wire to extend the four contact points as the below picture. Related Products Si Ge GaAs Nb:SrTiO3 X-Ray analysis Silver Glue Materials
