Level Set Methods and Fast Marching Methods: Evolving Interfaces in Computational Geometry, Fluid Mechanics, Computer Vision, and Materials Science ... Computational Mathematics, Series Number 3)

JNC Academic Books Verified independent store

→

J. A. SethianCambridge University PressEdition: 2, 8/12/1999EAN 9780521645577, ISBN10: 0521645573Paperback, 404 pages, 22.9 x 15.5 x 2 cmLanguage: EnglishThis new edition of Profes sor Sethian's successful text provides an introduction to level set methods and fast marching methods, which are powerful numerical techniques for analyzing and computing interface motion in a host of settings. They rely on a fundamental shift in how one views moving boundaries; rethinking the natural geometric Lagrangian perspective and exchanging it for an Eulerian, initial value partial differential equation perspective. For this edition, the collection of applications provided in the text has been expanded, including examples from physics, chemistry, fluid mechanics, combustion, image processing, material science, fabrication of microelectronic components, computer vision, computer-aided design, and optimal control theory. This book will be a useful resource for mathematicians, applied scientists, practising engineers, computer graphic artists, and anyone interested in the evolution of boundaries and interfaces.Introduction1. Formulations of interface propagationPart I. Theory and Algorithms2. Theory of curve and surface evolution3. Hamilton–Jacobi equations and associated theory4. Numerical approximationsfirst attempt5. Numerical schemes for hyperbolic conservation laws6. Algorithms for the initial and boundary value formulations7. Efficient schemesadaptivity8. Triangulated versions of level set and fast marching methodextensions and variations9. Tests of basic methodsPart II. Applications10. Geometry11. Grid generation12 Image denoising13. Computer visionshape detection and recognition14. Fluid mechanics and materials sciencesadding physics15. Computational geometry and computer-aided-design16. First arrivals, optimizations, and control17. Applications to semi-conductor manufacturing18. Comments, conclusions, future directionsReferencesIndex. Show more