Low & Medium Magnification Resolution Test Specimens

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Aluminum-Tungsten Dendrites medium resolution test for Scanning Electron Microscopy The various spacings created by the dendritic structure give the gap test. The topographical arr angement of dendrites leads to the gray level test. The specimen is non-magnetic, vacuum clean, has no adverse reaction to the electron probe and requires no surface coating. It is most useful for working in the probe size range of 25 to 75nm.This standard is supplied unmounted with instructions and with a SEM micrograph.Sample size is approximately 10mm dia. x 4mm high. Show more