Multi75M-G (Also known as MagneticMulti75-G) Force Modulation AFM Probe with Magnetic Tip Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 60 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 3 N/m (1 - 7 N/m)* Resonance Frequency: 75 kHz (60 - 90 kHz)* Length: 225 µm (215 - 235 µm)* Width: 28 µm (23 - 33 µm)* Thickness: 3 µm (2 - 4 µm)* * typical range Coating Hard magnetic, medium momentum coating on tip side of the cantilever and aluminium reflex coating on detector side of the cantilever Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated AFM tip has a magnetic moment of roughly 10^-13 emu and coercivity of roughly 300 Oe. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! Hint:Magnetization often changes during shipping and storage as a result of variations in temperature, humidity and exposure to external magnetic fields. This is why we recommend that each AFM tip is re-magnetized with a permanent magnet before first use. The permanent magnet should be moved close to the AFM tip and then moved away from it along the AFM tip axis (perpendicular to the AFM cantilever plane). Usually, this simple procedure boosts the magnetic signal significantly.
