Micro-Jump / Phase Jump Screening

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Micro-jumps are an oscillator phenomenon where the frequency of the oscillator changes suddenly. These events are often random and non-repeatable. Also referred to as phase jumps, phase bursts, or phase pops, the nature of the micro-jump can cause system related problems, especially in phase locked applications. The sudden change in frequency (and therefore phase) can cause many phase lock loops to lose lock, something particularly troublesome in the GPS arena---where maintaining lock is vital to receiving uninterrupted navigation data. We perform micro-jump testing on virtually any electronic oscillator. Custom test fixtures and test profiles can be created to support any customer footprint, and temperatures ranging from -60 C to +200 C. Common Oscillator Types Tested: XO (Crystal Oscillator) VCXO (Voltage Controlled Crystal Oscillator) TCXO (Temperature Compensated Crystal Oscillator) VCTCXO (Voltage Controlled Temperature Compensated Crystal Oscillator) TCVCXO (Temperature CompensatedVoltage Controlled Crystal Oscillator) OCXO (Oven Controlled Crystal Oscillator) VCOCXO (Voltage Controlled Oven Controlled Crystal Oscillator) DOCXO (Double Oven Controlled Crystal Oscillator) MEMS Oscillator (Microelectromechanical System Oscillator) Common Temperature Ranges: 0 to +50 °C -20 to +70 °C -30 to +85 °C -40 to +85 °C -55 to +105 °C -55 to +125 °C Show more