Low-magnification 10× industrial objective with extraordinary 37mm working distance for reflected light microscopy requiring exceptional clearance. 🔬 10× Magnification, 0.20 NA — Wide field of view with excellent working distance for specimen survey and low-magnification inspection. 📏 37mm Super-Long Working Distance — Extraordinary clearance enables examination of thick specimens, large parts, and challenging sample configurations. 🌟 CFI60-2 Advanced Optics — Employs Nikon's phase Fresnel lens technology for high NA and long working distance with superior chromatic aberration correction. ∞ Infinity-Corrected Design — T Plan SLWD optics ensure compatibility with modern Nikon industrial microscope systems. ✨ Brand New Condition — Factory-new objective with full optical performance and manufacturer specifications. 🔧 Product Description The Nikon T Plan SLWD 10× Objective (MUE31100) is a specialized industrial objective designed for reflected light microscopy applications requiring extraordinary working distance. With an exceptional 37mm working distance—among the longest available for any microscope objective—this lens enables examination of specimens that would be completely inaccessible with standard objectives. The 10× magnification and 0.20 numerical aperture provide a wide field of view ideal for specimen survey, feature location, and low-magnification inspection. This magnification is particularly valuable for examining large parts, surveying extensive surface areas, and locating features of interest before switching to higher magnifications for detailed analysis. The 37mm super-long working distance (SLWD) is the defining feature of this objective, providing unprecedented clearance for industrial microscopy applications. This extraordinary working distance enables examination of: Very thick specimens or large industrial parts Samples mounted in deep fixtures or specialized holders Specimens with extreme topographical variation Parts requiring extensive manipulation or probing during observation Samples in environmental chambers or specialized enclosures Assemblies or components that cannot be disassembled for inspection The exceptional clearance also provides maximum protection against objective damage, making this lens ideal for production environments where operators examine irregularly shaped parts or work quickly under time pressure. The CFI60-2 optical design represents Nikon's advanced infinity-corrected platform, evolved from the original CFI60 system. This design employs Nikon's unique phase Fresnel lens technology, which enables the combination of high numerical aperture and extremely long working distance while maintaining highly corrected chromatic aberration. Traditional objective designs face fundamental trade-offs between working distance, numerical aperture, and aberration correction—the phase Fresnel lens approach overcomes these limitations, delivering optical performance that would be impossible with conventional lens designs. The T Plan (Transmitted/Universal Plan) designation indicates flat-field correction across the entire field of view, ensuring sharp focus from center to edge. This is particularly important at low magnifications where the field of view is large—flat-field correction eliminates the need to refocus when examining features at different positions in the field. The infinity-corrected design enables integration with tube lenses, beam splitters, camera systems, and other optical accessories without introducing aberrations, providing flexibility for digital documentation and analysis workflows. The M25 thread mount is compatible with Nikon infinity-corrected industrial microscopes including the Eclipse LV series and other CFI60-compatible systems. This unit is brand new, ready for demanding industrial inspection applications requiring exceptional working distance. 🔎 Typical Applications Large industrial part inspection Assembled component examination without disassembly Specimens in environmental chambers or specialized fixtures Quality control of thick or irregularly shaped parts Failure analysis requiring extensive sample manipulation In-situ inspection of mounted assemblies Educational demonstrations requiring large working clearance Any application where standard working distances are insufficient 📊 Key Specifications Specification Details Catalog Number MUE31100 Magnification 10× Numerical Aperture (NA) 0.20 Working Distance 37mm (Super-Long) Optical Design T Plan SLWD (Transmitted/Universal Plan, Super-Long Working Distance) Optical Platform CFI60-2 (phase Fresnel lens technology) Illumination Mode Reflected light (Epi) Correction Infinity-corrected Field Correction Plan (flat-field) Thread Type M25 Compatibility Nikon infinity-corrected microscopes Application Reflected light microscopy requiring exceptional working distance Condition New University purchase orders accepted. Contact us for volume pricing and institutional procurement options.
