OLYMPUS BX53M BRIGHTFIELD/DARKFIELD TRANSMITTED & REFLECTED LIGHT MICROSCOPE Achieve comprehensive materials science and metallurgical analysis with this premium dual-illumination research microscope, featuring: 🔬 Dual brightfield/darkfield capability for transmitted and reflected light imaging 💡 Dual LED illumination systems (5700K) for consistent, energy-efficient lighting 🎯 Complete 5-objective set (5x, 10x, 20x, 50x, 100x) with M PlanFL BD optics 👁️ Trinocular head with 3 observation positions (100:0, 0:100, 80:20) ⚙️ 5-position BF/DF nosepiece with DIC slot for advanced contrast techniques ✨ Factory-new condition with full Olympus specifications 🔧 System Description The Olympus BX53M represents the pinnacle of materials science microscopy, combining transmitted and reflected light capabilities in a single premium platform designed for metallography, materials analysis, and industrial quality control. This comprehensive system features dual LED illumination systems providing both transmitted and reflected light with consistent 5700K color temperature for accurate color reproduction and energy-efficient operation. The BX3M-RLA-S illuminator delivers both brightfield and darkfield reflected light capabilities, essential for revealing surface features, grain structures, and material defects that would be invisible in brightfield alone. The trinocular observation head offers three selectable beam-splitting positions (100% binocular, 100% camera, or 80% binocular/20% camera), enabling simultaneous visual observation and digital documentation. The system includes a complete set of five M PlanFL BD objectives (5x/0.15 NA, 10x/0.30 NA, 20x/0.46 NA, 50x/0.80 NA, 100x/0.90 NA) providing magnifications from 50x to 1000x with excellent flat-field correction and brightfield/darkfield performance. The 5-position nosepiece includes a DIC slot for differential interference contrast imaging, while the 1.1 NA Abbe condenser ensures optimal specimen illumination. The precision 4" x 4" right-hand mechanical stage provides smooth, accurate specimen positioning. Factory-new condition ensures optimal performance and reliability for demanding research and industrial applications. 🔎 Typical Applications Metallography and metal microstructure analysis Materials science research and failure analysis Quality control and industrial inspection Semiconductor and electronics inspection Geological and mineralogical studies Forensic materials analysis 📊 Complete System Configuration Component Specification Microscope Frame Olympus BX53M Illuminator BX3M-RLA-S Brightfield/Darkfield Observation Head Trinocular, 3 positions (100:0, 0:100, 80:20) Eyepieces 10x/22mm Widefield (pair) Nosepiece 5-position BF/DF with DIC slot Stage 4" x 4" Right-hand mechanical stage Reflected Light BX3MLEDR LED lamp housing, 5700K Transmitted Light BX3MLEDT LED lamp housing, 5700K Condenser 1.1 NA Abbe condenser Objective 1 MPLFLN M PlanFL BD 5x/0.15 NA, 12mm WD Objective 2 MPLFLN M PlanFL BD 10x/0.30 NA, 6.5mm WD Objective 3 MPLFLN M PlanFL BD 20x/0.46 NA, 3.0mm WD Objective 4 MPLFLN M PlanFL BD 50x/0.80 NA, 1.0mm WD Objective 5 MPLFLN M PlanFL BD 100x/0.90 NA, 1.0mm WD Condition Factory-new Primary Advantage Complete dual-illumination system for comprehensive materials analysis University purchase orders are welcomed and accepted. Contact us for institutional pricing and procurement assistance.
Related
Related
Related
Related