The Olympus BX60M Reflected Light Brightfield, Darkfield & DIC Microscope is a fully configured, research-grade reflected light system built for demanding materials science, metallurgy, semiconductor inspection, and surface analysis applications — combining brightfield, darkfield, DIC/Nomarski, and polarized light in a single, versatile platform. 🔬 Five UM Plan FL BD objectives: 5x, 10x, 20x, 50x, and 100x — flat-field, high-contrast optics optimized for reflected light across the full magnification range 🌀 Brightfield and darkfield reflected light illuminator with 12V 100W quartz halogen lamphouse for versatile contrast switching 🔵 DIC/Nomarski system: U-DICR Nomarski prism slider, U-AN360 360° rotatable analyzer, and U-PO polarizer for high-contrast surface topography imaging 📷 3-position trinocular head for simultaneous observation and camera documentation 📍 Right-hand mechanical XY stage with stage finger for precise, repeatable specimen navigation ✅ Condition: Excellent — includes instruction manual, extra bulbs, and dust cover 🔧 Product Description The Olympus BX60M is a premier reflected light research microscope, and this configuration represents one of the most complete and capable setups available for materials characterization and industrial inspection. The reflected light brightfield/darkfield illuminator with 12V 100W quartz halogen lamphouse delivers bright, stable illumination across all five UM Plan FL BD objectives — 5x, 10x, 20x, 50x, and 100x — providing flat-field, high-contrast imaging from low-power survey to high-resolution surface detail. The U-DICR Nomarski prism slider, combined with the U-AN360 360° rotatable analyzer and U-PO polarizer, enables reflected light DIC imaging that reveals surface topography, grain boundaries, thin film structures, and microelectronic features with exceptional contrast and three-dimensional relief. Darkfield mode highlights surface defects, scratches, and particles that are invisible in brightfield. The 5-place BD nosepiece accommodates all five objectives for rapid magnification switching. The 3-position trinocular head supports simultaneous observation and digital documentation, while the right-hand mechanical XY stage with stage finger enables precise, repeatable specimen positioning. In excellent condition, this system ships complete with instruction manual, extra bulbs, and dust cover. 🔎 Typical Applications Metallurgical analysis and grain structure examination Semiconductor wafer and microelectronics inspection Thin film and coating surface characterization Surface defect detection and quality control Reflected light DIC for surface topography and relief imaging Darkfield inspection of scratches, particles, and surface anomalies 📊 Key Specifications Specification Details Frame Olympus BX60M reflected light Head 3-position trinocular Eyepieces 10x Widefield Nosepiece 5-place BD Objectives UM Plan FL 5x BD, 10x BD, 20x BD, 50x BD, 100x BD Illuminator Brightfield/Darkfield reflected light, 12V 100W quartz halogen DIC System U-DICR Nomarski prism slider, U-AN360 360° rotatable analyzer, U-PO polarizer Stage Right-hand mechanical XY with stage finger Accessories Included Instruction manual, extra bulbs, dust cover Condition Excellent SKU BX60M-DIC Country of Origin Japan Weight 35 lbs University and institutional purchase orders are welcome. Please contact us for invoicing and procurement documentation.
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