Olympus U-CTB Thick Berek Compensator Precision Berek compensator for quantitative retardation measurement in polarized light microscopy — ideal for materials science, geological analysis, and advanced birefringence characterization requiring accurate optical path difference measurement. 📊 Quantitative Retardation Measurement — measures optical path difference of birefringent specimens with high precision 🔬 Thick Berek Design — extended retardation range for measurement of strongly birefringent materials ✅ Compatible with Olympus BX and UIS2 microscope systems 🎓 New condition 🔧 Product Description The Olympus U-CTB is a thick Berek compensator for quantitative retardation measurement in polarized light microscopy. The Berek compensator uses a tilting calcite plate to introduce a variable, calibrated retardation into the optical path, allowing precise measurement of the optical path difference (OPD) of birefringent specimens. The thick design extends the measurable retardation range compared to standard Berek compensators, making it suitable for strongly birefringent materials such as minerals, polymers, and liquid crystals. It inserts into the optical path of Olympus BX and UIS2 series microscopes and is used in conjunction with crossed polarizers for quantitative birefringence analysis. 🔎 Typical Applications Quantitative birefringence and retardation measurement Mineral identification and optical crystallography Polymer and liquid crystal characterization Stress and strain analysis in optical materials Advanced geological thin section analysis Research-grade polarized light microscopy 📊 Key Specifications Specification Details Type Thick Berek Compensator Function Quantitative optical path difference measurement Compatibility Olympus BX and UIS2 series microscopes SKU OLYMPUS-U-CTB Condition New 🎓 University purchase orders accepted. Contact us for volume pricing and institutional procurement options.
