160AC-FG OPUS® High Aspect Ratio Standard Tapping Mode AFM Cantilever with Au Reflective Coating AFM Probe Specifications: Coating Reflective Gold Additional Info The 160AC-FG AFM probes with carbon nanofibers at the end of the silicon AFM tips are designed for tapping mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex. The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface. The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated. AFM Tip: Shape Height Setback Radius High-Aspect-Ratio 14 µm (12 - 16 µm)* 0 µm < 10 nm * typical values AFM Cantilever: Cantilever Shape Force Const. Res. Freq. Length Width Thickness High aspect ratio tapping mode AFM cantilever Beam 26 N/m(8 - 57 N/m)* 300 kHz(200 - 400 kHz)* 160 µm(150 - 170µm)* 40 µm(38 - 42µm)* 4µm(3.5 - 4.5 µm)* * typical values 240AC-FG OPUS® High Aspect Ratio Soft Tapping Mode AFM Cantilever with Au Reflective Coating AFM Probe Specifications: Coating Reflective Gold Additional Info The 240AC-FG AFM probes with carbon nanofibers at the end of the silicon AFM tips are designed for soft tapping mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex. The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface. The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated. AFM Tip: Shape Height Setback Radius High-Aspect-Ratio 14 µm (12 - 16 µm)* 0 µm < 10 nm * typical values AFM Cantilever: Cantilever Shape Force Const. Res. Freq. Length Width Thickness High aspect ratio soft tapping mode AFM cantilever Beam 2 N/m(0.6 - 3.9 N/m)* 70 kHz(45 - 90 kHz)* 240 µm(230 - 250µm)* 40 µm(38 - 42µm)* 2.6µm(2.1 - 3.1 µm)* * typical values OPUS AFM Probes: Optimized Positioning Upon Sample Olympus replacement AFM probes In September 2022 Olympus®* Corp. decided to discontinue all their Olympus®* AFM probes. OPUS AFM tips are identical to Olympus®* AFM tips in form, fit and function. *Olympus® is a trademark of Olympus Corporation
