OPUS® High Speed Scanning AFM Tips

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55AC-NA OPUS® High Frequency Tapping Mode AFM Cantilever with Al Reflective Coating AFM Probe Specifications: Coating Reflective Aluminum Additional Info AFM probes of the 55AC ser ies are designed for high speed AFM imaging. The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface. The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum. For operation in liquids we recommend using the 55AC-NG with a reflective gold coating. AFM Tip: Shape Height Setback Radius Half Cone Angle Optimized Positioning 14 µm (12 - 16 µm)* 0 µm < 7 nm 0° front, 35° back, Show more