Highlights: Fast roughness detection Portable Large OLED display Measurement of Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc Numeric and graphic display The PCE RT 2000 9 Parameter Profilometer Surface Roughness Tester is used for accurate measurement of surface roughness and can be used on most surfaces. The roughness is precisely recorded via the piezo sensor. This device measures in the ranges Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc. The profilometer is simply placed on the surface for measurement. During the measurement process, a probe is pulled over the surface and the device displays the measured value on the large, OLED display. In addition to the numerical measured value display, the measuring profile can be graphically visualized. The device is powered by a rechargeable battery and the charger is included. The profilometer has an automatic shut-off function for the battery care. The profilometer has a Micro USB cable which can also be used to charge it. Also, measurement data can be transmitted from the profilometer to the software so it is possible to create a complete documentation of the measurement. Features: OLED display Measures Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc Numerical and graphical display of measured values Micro USB cable 3 different cutoff wavelengths PC software Statistical functions Battery operation Specifications: Measurement parameters: Ra, Rq, Rsm, Rsk, Rz, Rt, Rp, Rv, Rc Measuring ranges: Ra, Rq, Rc: 0.005 µm ... 16 µm Rz, Rt, Rp, Rv: 0.02 µm ... 200 µm Rsm: 5 µm ... 1000 µm Rsk: -1 ... 1 Radius stylus tip: 5 µm Material stylus tip: Diamond, 90° angled Max. Recommended force for static measurement: 4 mN (0.4 gf) Measuring principle: Inductive Radius longitudinal guide bar: 45 mm / 1.8 in Standards: ANSIB46.1/ASMEB46.1 (DIN EN ISO 4287) Maximum driving distance: 15 mm / 0.6 in Cut-off wavelength (cut off): 0.135 mm / s at cut-off wavelength: 0.25 mm 0.5 mm / s at cut-off wavelength: 0.8 mm 1 mm / s at cut-off wavelength: 2.5 mm Reversing speed: 1 mm / s Measurement accuracy:
