Description The National Instruments PXI-2532 is a high-density matrix switch module designed for PXI systems. It supports up to 4,096 crosspoints, configurable in various matrix arrangements, and is ideal for complex signal routing in automated test applications. Technical Specifications Condition New/Never Used Surplus Brand National Instruments Category PLCs/Machine Control Part Number PXI-2532 Subcategory PLC Module/Rack Weight 1 lbs Crosspoints 512 Maximum Switching Voltage 100 V Maximum Current 0.5 A (switching or carry, per channel) Pollution Degree 2 Maximum Altitude 2,000 m Operating Temperature 0 °C to 55 °C Storage Temperature -20 °C to 70 °C Humidity 5% to 85%, non-condensing Dimensions 8.5 x 0.8 x 5.1 in. Banks 16 Information About PXI-2532 The National Instruments PXI-2532 is a high-density matrix switch module designed for PXI systems, offering versatile routing and switching capabilities for automated test applications. It supports complex signal routing in a compact PXI form factor, making it suitable for use in large-scale automated test equipment (ATE) systems. Key Features: Matrix Configuration: Configurable as a 4x2176, 8x1088, 16x544, or other scalable matrix configurations with external terminal blocks. High Density: Offers up to 4,096 crosspoints in a single PXI module, enabling efficient use of PXI chassis space. Switching Capabilities: Maximum switching voltage: 100 VDC or 100 VAC. Maximum current: 2 A (switching), 2 A (carry). Compatibility: Integrates seamlessly with PXI systems and is controlled via NI-SWITCH driver software or LabVIEW for easy programming. Durability: Rated for 100,000 cycles at full load, ensuring long-term reliability in demanding test environments. Ease of Use: Compatible with NI TB-264x terminal blocks for flexible matrix configurations. The PXI-2532 is ideal for: Semiconductor testing. RF and mixed-signal testing. Functional verification in production environments. This module provides exceptional scalability and flexibility for complex switching requirements in automated test systems.
