General view of the HQ:NSC35/Tipless and HQ:NSC36/Tipless AFM cantilevers General view of the HQ:CSC37/Tipless and HQ:CSC38/Tipless AFM cantilevers AFM Probe materialn-type siliconAFM Probe bulk resistivity0.01-0.025 Ohm*cm The AFM probes in the Tipless series offer three different AFM cantilevers on one side of the chip without AFM tips. They can be used in various applications such as gluing microspheres or custom tip pyramids. HQ:NSC35 and HQ:NSC36 series AFM probes feature 3 different soft tapping mode AFM cantilevers, while HQ:CSC37 and HQ:CSC38 series AFM probes feature 3 different contact mode AFM cantilevers. 3 AFM Cantilevers Series AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 35 series Cantilever A 130 205 290 2.7 8.9 24 Cantilever B 185 300 430 4.8 16 44 Cantilever C 95 150 205 1.7 5.4 14 36 series Cantilever A 30 90 160 0.1 1.0 4.6 Cantilever B 45 130 240 0.2 2 9 Cantilever C 25 65 115 0.06 0.6 2.7 37 series Cantilever A 30 40 55 0.3 0.8 2 Cantilever B 15 20 30 0.1 0.3 0.6 Cantilever C 20 30 40 0.1 0.4 1 38 series Cantilever A 8 20 32 0.01 0.09 0.36 Cantilever B 5 10 17 0.003 0.03 0.13 Cantilever C 6 14 23 0.005 0.05 0.21 Application Tipless AFM cantilevers are often used for custom applications such as for example attaching spheres or other objects for force spectroscopy measurements. HQ:NSC35/tipless/No Al Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers AFM probes of the HQ:NSC35 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 8.9 N/m(2.7 - 24 N/m) 205 kHz(130 - 290 kHz) 110 µm(105 - 115µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 16 N/m(4.8 - 44 N/m) 300 kHz(185 - 430 kHz) 90 µm(85 - 95µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 5.4 N/m(1.7 - 14 N/m) 150 kHz(95 - 205 kHz) 130 µm(125 - 135µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:NSC36/tipless/No Al Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Low Force Constant AFM probes of the HQ:NSC36 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 1 N/m(0.1 - 4.6 N/m) 90 kHz(30 - 160 kHz) 110 µm(105 - 115µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 2 N/m(0.2 - 9 N/m) 130 kHz(45 - 240 kHz) 90 µm(85 - 95µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.6 N/m(0.06 - 2.7 N/m) 65 kHz(25 - 115 kHz) 130 µm(125 - 135µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:CSC37/tipless/No Al Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.8 N/m(0.3 - 2 N/m) 40 kHz(30 - 55 kHz) 250 µm(245 - 255µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 0.3 N/m(0.1 - 0.6 N/m) 20 kHz(15 - 30 kHz) 350 µm(345 - 355µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 0.4 N/m(0.1 - 1 N/m) 30 kHz(20 - 40 kHz) 300 µm(295 - 305µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:CSC38/tipless/No Al Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers, Low Force Constant AFM probes of the HQ:CSC38 series have three different tipless soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.09 N/m(0.01 - 0.36 N/m) 20 kHz(8 - 32 kHz) 250 µm(245 - 255µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 0.03 N/m(0.003 - 0.13 N/m) 10 kHz(5 - 17 kHz) 350 µm(345 - 355µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.05 N/m(0.005 - 0.21 N/m) 14 kHz(6 - 23 kHz) 300 µm(295 - 305µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:NSC35/tipless/Cr-Au Tipless AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers AFM probes of the HQ:NSC35 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°. Coating Gold Overall AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 8.9 N/m(2.7 - 24 N/m) 205 kHz(130 - 290 kHz) 110 µm(105 - 115µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 16 N/m(4.8 - 44 N/m) 300 kHz(185 - 430 kHz) 90 µm(85 - 95µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 5.4 N/m(1.7 - 14 N/m) 150 kHz(95 - 205 kHz) 130 µm(125 - 135µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:NSC36/tipless/Cr-Au Tipless AFM Probe with 3 Different Gold Coated Soft Tapping Mode AFM Cantilevers, Low Force Constant AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 1 N/m(0.1 - 4.6 N/m) 90 kHz(30 - 160 kHz) 110 µm(105 - 115µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 2 N/m(0.2 - 9 N/m) 130 kHz(45 - 240 kHz) 90 µm(85 - 95µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.6 N/m(0.06 - 2.7 N/m) 65 kHz(25 - 115 kHz) 130 µm(125 - 135µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:CSC37/tipless/Cr-Au Tipless AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°. Coating Gold Overall AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.8 N/m(0.3 - 2 N/m) 40 kHz(30 - 55 kHz) 250 µm(245 - 255µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 0.3 N/m(0.1 - 0.6 N/m) 20 kHz(15 - 30 kHz) 350 µm(345 - 355µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 0.4 N/m(0.1 - 1 N/m) 30 kHz(20 - 40 kHz) 300 µm(295 - 305µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:CSC38/tipless/Cr-Au Tipless AFM Probe with 3 Different Gold Coated Contact Mode AFM Cantilevers, Low Force Constant AFM probes of the HQ:CSC38 series have three different tipless soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The overall 30 nm Au coating with 20 nm Cr sublayer is electrically conductive and chemically inert. It also ehnances the laser reflectivity of the AFM cantilevers in air and liquids. The coating may cause AFM cantilever bending up to 3°. Coating Gold Overall AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.09 N/m(0.01 - 0.36 N/m) 20 kHz(8 - 32 kHz) 250 µm(245 - 255µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 0.03 N/m(0.003 - 0.13 N/m) 10 kHz(5 - 17 kHz) 350 µm(345 - 355µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.05 N/m(0.005 - 0.21 N/m) 14 kHz(6 - 23 kHz) 300 µm(295 - 305µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:NSC35/tipless/Al BS Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Reflective Aluminum AFM probes of the HQ:NSC35 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 8.9 N/m(2.7 - 24 N/m) 205 kHz(130 - 290 kHz) 110 µm(105 - 115µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 16 N/m(4.8 - 44 N/m) 300 kHz(185 - 430 kHz) 90 µm(85 - 95µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 5.4 N/m(1.7 - 14 N/m) 150 kHz(95 - 205 kHz) 130 µm(125 - 135µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:NSC36/tipless/Al BS Tipless AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Low Force Constant, Reflective Aluminum AFM probes of the HQ:NSC36 series have three different tipless soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 1 N/m(0.1 - 4.6 N/m) 90 kHz(30 - 160 kHz) 110 µm(105 - 115µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 2 N/m(0.2 - 9 N/m) 130 kHz(45 - 240 kHz) 90 µm(85 - 95µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.6 N/m(0.06 - 2.7 N/m) 65 kHz(25 - 115 kHz) 130 µm(125 - 135µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:CSC37/tipless/Al BS Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers, Reflective Aluminum AFM probes of the HQ:CSC37 series have three different tipless contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.8 N/m(0.3 - 2 N/m) 40 kHz(30 - 55 kHz) 250 µm(245 - 255µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 0.3 N/m(0.1 - 0.6 N/m) 20 kHz(15 - 30 kHz) 350 µm(345 - 355µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 0.4 N/m(0.1 - 1 N/m) 30 kHz(20 - 40 kHz) 300 µm(295 - 305µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:CSC38/tipless/Al BS Tipless AFM Probe with 3 Different Contact Mode AFM Cantilevers, Low Force Constant, Reflective Aluminum AFM probes of the HQ:CSC38 series have three different tipless soft contact mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Tipless AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.09 N/m(0.01 - 0.36 N/m) 20 kHz(8 - 32 kHz) 250 µm(245 - 255µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 0.03 N/m(0.003 - 0.13 N/m) 10 kHz(5 - 17 kHz) 350 µm(345 - 355µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.05 N/m(0.005 - 0.21 N/m) 14 kHz(6 - 23 kHz) 300 µm(295 - 305µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values
