TipsNano TGT1 SPM AFM Tip Diffraction Grating Tip Sharpness Silicon Grid Array NTMDT NT-MDT Used, see photos. Part of the grid is slightly scratched, but other parts if the grid can be used. From the manufacturer: Calibration grating TGT1 is intended for tip shape and sharpness estimation and further using in deconvolution program; tip degradation and contamination control. General Features Structure the grating is formed on Si wafer top surface Pattern type 3-D array of sharp tips Period 3±0,05 µm Height 0.3 - 0.5µm Chip size 5x5x0,5 mm Effective area central square 2x2 mm Tip angle 50±10 degrees (on the very tip end) Tip curvature radius ≤10nm Diagonal period 2,12 µm Test grating TGT1 is intended for: - for 3-D visualization of the scanning tip; - determination of tip sharpness parameters (aspect ratio), tip degradation and contamination control.
