Chris JacobsenCambridge University Press, 12/19/2019EAN 9781107076570, ISBN10: 1107076579Hardcover, 587 pages, 25.4 x 18.3 x 3 cmLanguage: EnglishWritten by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a 'one-stop' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.1. X-ray microscopesa short introduction2. A bit of history3. X-ray physics4. Imaging Physics5. X-ray focusing optics6. X-ray microscope systems7. X-ray microscope instrumentation8. X-ray tomography9. X-ray spectromicroscopy10. Coherent imaging11. Radiation damage and cryo microscopy12. Applications, and future prospects.
