XRF-32-LD is high throughput 32-sample X-ray fluorescence (XRF) / energy dispersive spectrometer (EDS) system ( Made by Olympus ) for non-destructive composition analysis. The station integrates a handheld XRF spectrometer with XY stage, 32-sample station, and laptop remote control. It enables quick and easy composition analysis of samples (elements from Mg to Bi), with concentrations as low as 0.01%. The system automation provides 32-sample testing, analysis, and result output in one autorun with the push of a single button. It is an excellent tool for high throughput research and development of powder and bulk materials, for applications such as high-entropy alloys, novel magnetic materials, solid ceramic electrolyte materials, etc SPECIFICATIONS: Features The high throughput XRF station consists of: Handheld XRF spectrometer made by Olympus. XRF spectrometer holder and triggering mechanism XY stage system and its control box 32-position transparent sample stage (no interference to XRF signal) Laptop with pre-installed control and analysis software Station cabinet with warning lights and lead glass for X-ray safety The automatic operation improves efficiency, reduces operator-related error, and minimizes X-ray exposure Fast, automatic XRF measurement and analysis of 32 samples (~20 min depending on the testing time), and automatic output of composition/spectrum data via a USB port The XRF system can be upgraded with 1D line scan and 2D mapping scan features at the extra cost Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove box, etc Power Input XY stage: 220 VAC, 50/60 Hz, Single Phase For using at 110V, please order a 200W 110-220V transformer by clicking this link XRF spectrometer: 18 VDC input (100 - 240 VAC power adapter included) XRF Spectrometer X-ray Source: X-ray tube: 4 W Rh target X-ray tube (optional Ag, Au, or Ta target available) Voltage: 40 kV max (50 kV option available) Current: 200 μA max Spot size: 3 mm (with collimator) and 9 mm Window Material: Beryllium (Be) Window guard: Kapton and Prolene window protection films Detector: SDD (Silicon drift detector): High energy resolution (165 eV FWHM) for general detection covering the whole element range Detector size: 25 mm2 large area detector for high count rate Window Material: Beryllium (Be) Features: An element library for alloy elements are pre-installed: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi (Customized element library is available upon request) Integrated CMOS camera for observing the measurement area on the sample surface Built-in sample proximity sensor to close X-ray shutter if no sample is detected near the detector USB / Bluetooth connection to a laptop for remote control and data output XRF Holder & Trigger A XRF spectrometer holder with trigger-pressing mechanism is integrated into the system for continuous, automatic measurement The XRF measurement time can be controlled by setting the press-down time of the trigger mechanism XY Sample Stage Touch screen controlled XY stage for precise sample positioning and measurement repeatability XRF measurement time, X- / Y- axis travel speed, sample selections can be configured on the control box touch screen 32-sample transparent stage (no interference to XRF signal) for as-received arc melting samples (≤10 g) (max sample size: 20 mm) is included. The sample is supported by XRF transparent Prolene film for maximized XRF signal Station Cabinet Station cabinet with warning lights and lead glass for X-ray operation safety XY stage control box is integrated into the station cabinet An optional high-accuracy digital Geiger counter/dosimeter can be mounted on the cabinet for monitoring the radiation level (Click the photo below) XRF Control & Analysis A laptop with pre-installed XRF control software and spectrum analysis software are included for XRF spectrometer remote control and data analysis The control/analysis software is capable of Adjust measurement settings: X-ray voltage/current, testing time, spot size, measurement repeats Real-time observation of measurement area on the sample surface using the integrated CMOS camera Default element library for alloy elements: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi A customized element library (up to 40 elements) for ceramic analysis or other applications is available upon request Fundamental parameters analysis, both qualitatively and quantitatively Full correction on attenuation in air and absorption of window/window guard Auto-mode for continuous or repeated analysis Options The XRF system can be upgraded with 1D line scan and 2D mapping scan features at extra cost Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove box, etc Compliance XRF spectrometer: CE, FCC (USA), ICES-001 (Canada) approval EQ-XRF-32-LD is CE certified. Application Notes Pic. 1 You may use a 100T hydraulic press with a special die to prepare an XRF sample in high throughput (Pic. 1) Users must be trained in radiation safety and fully understand the radiation precautions and instructions provided Close the cabinet door and stay 0.5 m clear of the cabinet before conducting an XRF measurement to minimize radiation
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