Applied Crystallography - Proceedings Of The Xvi Conference

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This volume covers the following areas — phase characterisation using diffraction methods; correction factors in powder diffraction; Rietveld method application; substructure analy sis in textured materials; texture inhomogeneity and its determination; new X-ray diffraction methods; small angle scattering studies in crystalline and amorphous solids; X-Ray stress analysis; phase transitions particularly crystallography and pecularities of the reversible martensitic transformation; structure on non-crystalline materials and their crystallisation; structure and properties of new materials.Format: HardcoverNo of Pages: 500Imprint: World ScientificPublication date: 19950501 Show more