Applied Crystallography - Proceedings Of The Xvii International Conference

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This proceedings volume contains research data on structural investigation of materials of high industrial value. In particular, the following issues are discussed: phase character ization by diffraction methods, application of direct methods for solving crystal structure from powder diffraction, electron crystallography, Rietveld method application, defects and substructure analysis in materials, new X-ray methods, small angle scattering studies of crystalline and amorphous solids, phase transformation studies including crystallography of the reversible martensitic transformation, structure of noncrystalline materials, structure and properties of new materials.Format: HardcoverNo of Pages: 512Imprint: World ScientificPublication date: 19980806 Show more