240AC-NN OPUS® Soft Tapping Mode AFM Cantilever without Coating AFM Probe Specifications: Coating none Additional Info AFM probes of the 240AC series are designed for tapping mode AFM imaging of soft samples. The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface. The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever Quality factor. AFM Tip: Shape Height Setback Radius Half Cone Angle Optimized Positioning 14 µm (12 - 16 µm)* 0 µm < 7 nm 0° front, 35° back,
