AFM probes with medium soft AFM cantilevers for soft tapping mode HQ AFM tip close-up Typical radius of uncoated AFM tip8 nmFull AFM tip cone angle40°Total AFM tip height12 - 18 µmAFM probe materialn-type siliconAFM probe bulk resistivity0.01 - 0.025 Ohm·cm The HQ:NSC and HQ:XSC AFM tips have trihedral shape with a full cone angle of 40° and even smaller at the last 200nm of the AFM tip apex. The standard tapping mode AFM probes feature stiff AFM cantilevers with high resonance frequencies and force constants above 40N/m. These AFM probes are generally used for imaging hard samples where high topographic and phase contrast are needed. They are also suitable for non-contact mode operation. The optional aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. There is a range of available AFM cantilever coatings for the tip side and back side. Please check the other catalog categories for coated versions of the standard tapping mode AFM probes. The highly successful HQ series now extends over all AFM probe series with 1, 3 and 4 AFM cantilevers. 1 AFM Cantilever Series AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 14 series 110 160 220 1.8 5.0 13 18 series 60 75 90 1.2 2.8 5.5 19 series 25 65 120 0.05 0.5 2.3 3 AFM Cantilevers Series AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 35 series Cantilever A 130 205 290 2.7 8.9 24 Cantilever B 185 300 430 4.8 16 44 Cantilever C 95 150 205 1.7 5.4 14 36 series Cantilever A 30 90 160 0.1 1.0 4.6 Cantilever B 45 130 240 0.2 2 9 Cantilever C 25 65 115 0.06 0.6 2.7 4 AFM Cantilevers Series AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 11 series Cantilever A 12 15 18 0.1 0.2 0.4 Cantilever B 60 80 100 1.1 2.7 5.6 Cantilever C 115 155 200 3 7 16 Cantilever D 250 350 465 17 42 90 Application Most of the routine topography imaging experiments require AFM probes of about 8 to 10nm radius. Using these AFM probes, lateral resolution down to 5nm is attainable for scan size below 1μm. Usually, sharpened silicon etched AFM probes are used for general purpose measurements. Polymer Spherulite on Mica. 10 µm topography scan. AFM Image obtained with MikroMasch® HQ:NSC14/Al BS AFM probe on Smart SPM ( AIST-NT Inc, Novato, CA).Image courtesy of Fedor Kraev, UC Davis 4µm topography image and corresponding section analysis of a single layer graphene oxide flake on mica. AFM Image obtained with MikroMasch® HQ:NSC14/Al BS AFM probe on Smart SPM ( AIST-NT Inc, Novato, CA).Image courtesy of Fedor Kraev, UC Davis 200nm topography scan of SAM of Palmityl Palmitate on HOPG. AFM Image obtained with MikroMasch® HQ:NSC14/Al BS AFM probe with closed loop in XY using Smart SPM ( AIST-NT Inc, Novato, CA).Image courtesy of Fedor Kraev, UC Davis 20x20 nm topography (left) and the phase shift image of SAM of Cholesteryl Stearate on HOPG. True molecular resolution is achieved in ambient conditions using MikroMasch® HQ:NSC14/Al BS AFM probe on SmartSPM ( AIST-NT Inc. Novato, CA).Image courtesy of Dmitry Evplov, AIST-NT Inc. 20x20 nm topography (left) and the phase shift image of SAM of Cholesteryl Stearate on HOPG. True molecular resolution is achieved in ambient conditions using MikroMasch® HQ:NSC14/Al BS AFM probe on SmartSPM ( AIST-NT Inc. Novato, CA).Image courtesy of Dmitry Evplov, AIST-NT Inc 15 nm topography scan of SAM of Cholesteryl Stearate on HOPG. AFM Image obtained with MikroMasch® HQ:NSC14/Al BS AFM probe on SmartSPM ( AIST-NT Inc, Novato, CA).Image courtesy of Andrey Krayev, AIST-NT Inc Tapping mode topography image of self-assembled structures of semifluorinated alkanes on silicon (Agilent 5500 AFM). Scan size 350x350nm. Scan height 5nm. The scan is obtained using a soft tapping mode AFM probe.Image courtesy of S. Magonov, Agilent Technologies. HQ:NSC14/Al BS Soft Tapping Mode AFM Probe, Reflective Aluminum Coating AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC15/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 5 N/m(1.8 - 13 N/m) 160 kHz(110 - 220 kHz) 125 µm(120 - 130µm) 25 µm(22 - 28µm) 2.1 µm(1.6 - 2.6 µm) All typical values HQ:NSC35/Al BS Soft Tapping Mode AFM Probe with 3 Different AFM Cantilevers , Reflective Aluminum Coating AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC35/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 8.9 N/m(2.7 - 24 N/m) 205 kHz(130 - 290 kHz) 110 µm(105 - 115µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 16 N/m(4.8 - 44 N/m) 300 kHz(185 - 430 kHz) 90 µm(85 - 95µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 5.4 N/m(1.7 - 14 N/m) 150 kHz(95 - 205 kHz) 130 µm(125 - 135µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:NSC18/Al BS Soft Tapping and Lift Modes AFM Probe, Reflective Aluminum Coating AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC18/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 2.8 N/m(1.2 - 5.5 N/m) 75 kHz(60 - 90 kHz) 225 µm(220 - 230µm) 27.5 µm(24.5 - 30.5µm) 3 µm(2.5 - 3.5 µm) All typical values HQ:XSC11/Al BS AFM Probe with 4 Different Cantilevers for Various Applications AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC36/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.2 N/m(0.1 - 0.4 N/m) 15 kHz(12 - 18 kHz) 500 µm(495 - 505µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever B Beam 2.7 N/m(1.1 - 5.6 N/m) 80 kHz(60 - 100 kHz) 210 µm(205 - 215µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever C Beam 7 N/m(3 - 16 N/m) 155 kHz(115 - 200 kHz) 150 µm(145 - 155µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever D Beam 42 N/m(17 - 90 N/m) 350 kHz(250 - 465 kHz) 100 µm(95 - 105µm) 50 µm(47 - 53µm) 2.7 µm(2.2 - 3.2 µm) All typical values HQ:NSC19/Al BS Soft Tapping Mode and LFM AFM Probe AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM probes are also used in Lateral force microscopy due to their high sensitivity to lateral forces. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC18/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.5 N/m(0.05 - 2.3 N/m) 65 kHz(25 - 120 kHz) 125 µm(120 - 130µm) 22.5 µm(19.5 - 25.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:NSC36/Al BS AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC36/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 1 N/m(0.1 - 4.6 N/m) 90 kHz(30 - 160 kHz) 110 µm(105 - 115µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 2 N/m(0.2 - 9 N/m) 130 kHz(45 - 240 kHz) 90 µm(85 - 95µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.6 N/m(0.06 - 2.7 N/m) 65 kHz(25 - 115 kHz) 130 µm(125 - 135µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:NSC14/No Al Soft Tapping Mode AFM Probe, No Coating AFM probes of the HQ:NSC14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by the tapping AFM tip. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 5 N/m(1.8 - 13 N/m) 160 kHz(110 - 220 kHz) 125 µm(120 - 130µm) 25 µm(22 - 28µm) 2.1 µm(1.6 - 2.6 µm) All typical values HQ:NSC18/No Al Soft Tapping and Lift Mode AFM Probe, No Coating AFM probes of the HQ:NSC18 series are suitable for soft tapping and Lift mode operation AFM (e.g. EFM and MFM) since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM probes are also used for mapping of materials properties in Force modulation mode and true topography imaging of soft samples in Soft tapping mode. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 2.8 N/m(1.2 - 5.5 N/m) 75 kHz(60 - 90 kHz) 225 µm(220 - 230µm) 27.5 µm(24.5 - 30.5µm) 3 µm(2.5 - 3.5 µm) All typical values HQ:NSC19/No Al Soft Tapping Mode and LFM AFM Probe, No Coating AFM probes of the HQ:NSC19 series combine relatively high resonance frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at relatively high speeds in Soft tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM probes are also used in Lateral force microscopy due to their high sensitivity to lateral forces. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. * ScanAsyst® and PeakForce Tapping™ are trademarks of Bruker Corporation Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.5 N/m(0.05 - 2.3 N/m) 65 kHz(25 - 120 kHz) 125 µm(120 - 130µm) 22.5 µm(19.5 - 25.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:NSC35/No Al AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, No Coating AFM probes of the HQ:NSC35 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 8.9 N/m(2.7 - 24 N/m) 205 kHz(130 - 290 kHz) 110 µm(105 - 115µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever B Beam 16 N/m(4.8 - 44 N/m) 300 kHz(185 - 430 kHz) 90 µm(85 - 95µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) Cantilever C Beam 5.4 N/m(1.7 - 14 N/m) 150 kHz(95 - 205 kHz) 130 µm(125 - 135µm) 35 µm(32 - 38µm) 2 µm(1.5 - 2.5 µm) All typical values HQ:NSC36/No Al AFM Probe with 3 Different Soft Tapping Mode AFM Cantilevers, Low Force Constant, No coating AFM probes of the HQ:NSC36 series have three different soft tapping mode AFM cantilevers on one side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 1 N/m(0.1 - 4.6 N/m) 90 kHz(30 - 160 kHz) 110 µm(105 - 115µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever B Beam 2 N/m(0.2 - 9 N/m) 130 kHz(45 - 240 kHz) 90 µm(85 - 95µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) Cantilever C Beam 0.6 N/m(0.06 - 2.7 N/m) 65 kHz(25 - 115 kHz) 130 µm(125 - 135µm) 32.5 µm(29.5 - 35.5µm) 1 µm(0.5 - 1.5 µm) All typical values HQ:XSC11/No Al AFM Probe with 4 Different Cantilevers for Various Applications, No Coating AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.2 N/m(0.1 - 0.4 N/m) 15 kHz(12 - 18 kHz) 500 µm(495 - 505µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever B Beam 2.7 N/m(1.1 - 5.6 N/m) 80 kHz(60 - 100 kHz) 210 µm(205 - 215µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever C Beam 7 N/m(3 - 16 N/m) 155 kHz(115 - 200 kHz) 150 µm(145 - 155µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever D Beam 42 N/m(17 - 90 N/m) 350 kHz(250 - 465 kHz) 100 µm(95 - 105µm) 50 µm(47 - 53µm) 2.7 µm(2.2 - 3.2 µm) All typical values SEE MIKROMASCH PRODUCT CATALOGUE
