4XC-NN OPUS® 4 AFM Cantilevers without Coating for Various Applications AFM Probe Specifications: Coating none Additional Info AFM probes of the 4XC series feature four different AFM cantilevers for various measurement modes, two on each side of the holder chip: 500DC - Contact mode AFM cantilever 240AC - Soft tapping mode AFM cantilever for imaging soft samples 200AC - Standard tapping mode AFM cantilever 65AC - High resonance frequency AFM cantilever for High speed scanning The uncoated AFM probe offers sharp AFM tip apexes, chemical inertness and high AFM cantilever Quality factors. The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface. AFM Tip: Shape Height Setback Radius Half Cone Angle Optimized Positioning 14 µm (12 - 16 µm)* 0 µm < 7 nm 0° front, 35° back,
