Contact-G Contact Mode AFM Probe AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 0.2 N/m (0.07 - 0.4 N/m)* Resonance Frequency: 13 kHz (9 - 17 kHz)* Length: 450 µm (440 - 460 µm)* Width: 50 µm (45 - 55 µm)* Thickness: 2 µm (1 - 3 µm)* * typical range Coating Uncoated Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G! Consistent high quality at a lower price! ContAl-G Contact Mode AFM Probe with Aluminum Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 0.2 N/m (0.07 - 0.4 N/m)* Resonance Frequency: 13 kHz (9 - 17 kHz)* Length: 450 µm (440 - 460 µm)* Width: 50 µm (45 - 55 µm)* Thickness: 2 µm (1 - 3 µm)* * typical range Coating Aluminium reflex coating on detector side of the cantilever, 30 nm thick Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. For measurements in liquids please use the back side gold coated ContGD-G or the overall gold coated ContGB-G! Consistent high quality at a lower price! ContGD-G Contact Mode AFM Probe with Gold Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 0.2 N/m (0.07 - 0.4 N/m)* Resonance Frequency: 13 kHz (9 - 17 kHz)* Length: 450 µm (440 - 460 µm)* Width: 50 µm (45 - 55 µm)* Thickness: 2 µm (1 - 3 µm)* * typical range Coating Gold coating on detector side of the cantilever, 70 nm thick Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! SiNi Silicon Nitride Contact Mode AFM Probe with 2 Different Cantilevers on Each Side of Chip AFM Probe Specifications: AFM Tip Shape: Pyramid Height: 12 µm (10 - 14 µm)* Radius: < 15 nm Half Cone Angle: 35° (macroscopic) 4 AFM Cantilevers Short Cantilever Shape: Triangle Force Constant: 0.27 N/m Resonance Frequency: 30 kHz Length: 100 µm (90 - 110 µm)* Width: 16 µm (11 - 21 µm)* Thickness: 520 nm (470 - 570 nm)* Long Cantilever Shape: Triangle Force Constant: 0.06 N/m Resonance Frequency: 10 kHz Length: 200 µm (190 - 210 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 520 nm (470 - 570 nm)* * typical range Coating Gold/Chromium on detector side of the cantilever, 70 nm thick Alignment Grooves None Additional Info This competitively priced silicon nitride AFM probe features: 2 silicon nitride AFM cantilevers for soft contact mode with two different lengths and force constants mounted on each side of a standard silicon support chip silicon nitride wedge AFM tip overall AFM tip height of 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm macroscopic half cone angle of 35° 450 micron thick silicon holder chip Consistent high quality at a lower price!
