Tap300-G Tapping Mode AFM Probe AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 40 N/m (20 - 75 N/m)* Resonance Frequency: 300 kHz (200 - 400 kHz)* Length: 125 µm (115 - 135 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 4 µm (3 - 5 µm)* * typical range Coating Uncoated Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G! Consistent high quality at a lower price! Tap300Al-G Tapping Mode AFM Probe with Aluminum Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 40 N/m (20 - 75 N/m)* Resonance Frequency: 300 kHz (200 - 400 kHz)* Length: 125 µm (115 - 135 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 4 µm (3 - 5 µm)* * typical range Coating Aluminium reflex coating on detector side of the cantilever, 30 nm thick Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. For measurements in liquids please use the back side gold coated Tap300GD-G or the overall gold coated Tap300GB-G! Consistent high quality at a lower price! Tap190-G Tapping Mode AFM Probe with Long Cantilever AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 48 N/m (28 - 75 N/m)* Resonance Frequency: 190 kHz (160 - 220 kHz)* Length: 225 µm (215 - 235 µm)* Width: 38 µm (33 - 43 µm)* Thickness: 7 µm (6 - 8 µm)* * typical range Coating Uncoated Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. BudgetSensors' Tap190-G features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series. For measurements in liquids please use the back side gold coated Tap190GD-G or the overall gold coated Tap190GB-G!. Tap190Al-G Tapping Mode AFM Probe with Long Cantilever and Aluminum Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 48 N/m (28 - 75 N/m)* Resonance Frequency: 190 kHz (160 - 220 kHz)* Length: 225 µm (215 - 235 µm)* Width: 38 µm (33 - 43 µm)* Thickness: 7 µm (6 - 8 µm)* * typical range Coating Aluminium reflex coating on detector side of the cantilever, 30 nm thick Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. BudgetSensors' Tap190-G features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series. For measurements in liquids please use the back side gold coated Tap190GD-G or the overall gold coated Tap190GB-G!. Tap300GD-G Tapping Mode AFM Probe with Gold Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 40 N/m (20 - 75 N/m)* Resonance Frequency: 300 kHz (200 - 400 kHz)* Length: 125 µm (115 - 135 µm)* Width: 30 µm (25 - 35 µm)* Thickness: 4 µm (3 - 5 µm)* * typical range Coating Gold coating on detector side of the cantilever, 70 nm thick Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Consistent high quality at a lower price! Tap190GD-G Tapping Mode AFM Probe with Long Cantilever and Gold Reflective Coating AFM Probe Specifications: AFM Tip Shape: Rotated Height: 17 µm (15 - 19 µm)* Setback: 15 µm (10 - 20 µm)* Radius: < 10 nm Half Cone Angle: 20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Cantilever A Shape: Beam Force Constant: 48 N/m (28 - 75 N/m)* Resonance Frequency: 190 kHz (160 - 220 kHz)* Length: 225 µm (215 - 235 µm)* Width: 38 µm (33 - 43 µm)* Thickness: 7 µm (6 - 8 µm)* * typical range Coating Gold coating on detector side of the cantilever, 70 nm thick Alignment Grooves This product features alignment grooves on the back side of the holder chip. Additional Info Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated AFM tip allows for more symmetric representation of high sample features. The consistent AFM tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. BudgetSensors' Tap190-G features a longer AFM cantilever and it is meant as an alternative to BudgetSensors' Tap300 AFM probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum AFM cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series. Consistent high quality at a lower price!
