AFM probes with stiff AFM cantilevers for tapping or non-contact mode HQ AFM tip close-up Typical radius of uncoated AFM tip8 nmFull AFM tip cone angle40°Total AFM tip height12 - 18 µmAFM probe materialn-type siliconAFM probe bulk resistivity0.01 - 0.025 Ohm·cm The HQ:NSC and HQ:XSC AFM tips have trihedral shape with a full cone angle of 40° and even smaller at the last 200nm of the AFM tip apex. The standard tapping mode AFM probes feature stiff AFM cantilevers with high resonance frequencies and force constants above 40N/m. These AFM probes are generally used for imaging hard samples where high topographic and phase contrast are needed. They are also suitable for non-contact mode operation. The optional aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. There is a range of available AFM cantilever coatings for the tip side and back side. Please check the other catalog categories for coated versions of the standard tapping mode AFM probes. The highly successful HQ series now extends over all AFM probe series with 1, 3 and 4 AFM cantilevers. 1 AFM Cantilever Series AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 15 series 265 325 410 20 40 80 16 series 170 190 210 30 45 70 4 AFM Cantilevers Series AFM Cantilever Resonance Frequency, kHz Force Constant, N/m min typical max min typical max 11 series Cantilever A 12 15 18 0.1 0.2 0.4 Cantilever B 60 80 100 1.1 2.7 5.6 Cantilever C 115 155 200 3 7 16 Cantilever D 250 350 465 17 42 90 HQ:NSC15/Al BS Standard Tapping Mode AFM Probe AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC15/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 40 N/m(20 - 80 N/m) 325 kHz(265 - 410 kHz) 125 µm(120 - 130µm) 30 µm(27 - 33µm) 4 µm(3.5 - 4.5 µm) All typical values HQ:NSC16/Al BS Tapping Mode AFM Probe with Long AFM Cantilever AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilever by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC16/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 45 N/m(30 - 70 N/m) 190 kHz(170 - 210 kHz) 225 µm(220 - 230µm) 37.5 µm(34.5 - 40.5µm) 7 µm(6.5 - 7.5 µm) All typical values HQ:XSC11/Al BS AFM Probe with 4 Different Cantilevers for Various Applications AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The aluminum reflective coating enhances the laser reflectivity of the AFM cantilevers by approximately 2.5 times. For operation in liquids we recommend using the HQ:NSC36/Cr-Au BS with a reflective gold coating. Coating Reflective Aluminum AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.2 N/m(0.1 - 0.4 N/m) 15 kHz(12 - 18 kHz) 500 µm(495 - 505µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever B Beam 2.7 N/m(1.1 - 5.6 N/m) 80 kHz(60 - 100 kHz) 210 µm(205 - 215µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever C Beam 7 N/m(3 - 16 N/m) 155 kHz(115 - 200 kHz) 150 µm(145 - 155µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever D Beam 42 N/m(17 - 90 N/m) 350 kHz(250 - 465 kHz) 100 µm(95 - 105µm) 50 µm(47 - 53µm) 2.7 µm(2.2 - 3.2 µm) All typical values HQ:NSC15/Cr-Au BS Gold Coated Tapping Mode AFM Probe AFM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids. Coating Reflective Gold AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 40 N/m(20 - 80 N/m) 325 kHz(265 - 410 kHz) 125 µm(120 - 130µm) 30 µm(27 - 33µm) 4 µm(3.5 - 4.5 µm) All typical values HQ:NSC16/Cr-Au BS Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. The gold reflective coating enhances the laser reflectivity of the AFM cantilever in air and liquids. Coating Reflective Gold AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 45 N/m(30 - 70 N/m) 190 kHz(170 - 210 kHz) 225 µm(220 - 230µm) 37.5 µm(34.5 - 40.5µm) 7 µm(6.5 - 7.5 µm) All typical values HQ:NSC15/No Al Standard Tapping Mode AFM Probe FM probes of the HQ:NSC15 series are generally used in tapping mode for imaging hard samples when high topographic and phase contrast are necessary. These AFM probes are also suitable for non-contact mode. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 40 N/m(20 - 80 N/m) 325 kHz(265 - 410 kHz) 125 µm(120 - 130µm) 30 µm(27 - 33µm) 4 µm(3.5 - 4.5 µm) All typical values HQ:NSC16/No Al Tapping Mode AFM Probe with Long AFM Cantilever AFM probes of the HQ:NSC16 series have AFM cantilevers with a high spring constant and low resonance frequency (below 250 kHz) that can be used in tapping mode in SPMs with low-frequency feedback loops. These AFM probes also fit SPM systems that do not support short AFM cantilever arms. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 45 N/m(30 - 70 N/m) 190 kHz(170 - 210 kHz) 225 µm(220 - 230µm) 37.5 µm(34.5 - 40.5µm) 7 µm(6.5 - 7.5 µm) All typical values HQ:XSC11/No Al AFM Probe with 4 Different Cantilevers for Various Applications AFM probes of the HQ:XSC11 series have four different AFM cantilevers, two on each side of the holder chip. They can be used in various applications. The HQ AFM probes offer high consistency of the AFM tip radius, the AFM cantilever reflectivity and the quality factor. Coating none AFM Probe Specifications AFM Tip Shape Height Full Cone Angle Radius Rotated 15 µm (12 - 18 µm) 40° < 8 nm AFM Cantilever Cantilever Shape Force Const. Res. Freq. Length Width Thickness Cantilever A Beam 0.2 N/m(0.1 - 0.4 N/m) 15 kHz(12 - 18 kHz) 500 µm(495 - 505µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever B Beam 2.7 N/m(1.1 - 5.6 N/m) 80 kHz(60 - 100 kHz) 210 µm(205 - 215µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever C Beam 7 N/m(3 - 16 N/m) 155 kHz(115 - 200 kHz) 150 µm(145 - 155µm) 30 µm(27 - 33µm) 2.7 µm(2.2 - 3.2 µm) Cantilever D Beam 42 N/m(17 - 90 N/m) 350 kHz(250 - 465 kHz) 100 µm(95 - 105µm) 50 µm(47 - 53µm) 2.7 µm(2.2 - 3.2 µm) All typical values SEE MIKROMASCH PRODUCT CATALOGUE
